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Product Briefs
Spray and particle analysis
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The Cooke Corp.'s Spray & Particle Analysis System incorporates advanced CCD imaging technology. The system provides high spatial resolution (1280 x 1024) for detailed imaging of micron-sized particles, fast electronic shutter (100 ns) to arrest hypervelocity particles, 12-bit cooled CCD chip technology for high light sensitivity and sharp detail, multiple exposure and double frame capture modes, and computer control throughout image capture and analysis.
AEI March 2000
For more information, circle 98
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