SAE 2014 Aerospace Systems and Technology Conference

September 23-25, 2014

Cincinnati, Ohio, USA

Hyatt Regency Cincinnati

Obsolescence and Counterfeit Parts Management Technical Session Schedule

Wednesday, September 24

Sponsored by:

TTI Family of Companies

The objective of this session is to explore methods to identify, assess the risk, avoid, test and eliminate counterfeit components in electronic equipment applications.

Session organized by leaders of the SAE G-19 standards committees, which has produced the AS5553, AS6081, and AS6171 standards for counterfeit avoidance, and all present at this event.

Organizers - Diganta Das, Univ. of Maryland; Mirko Jakovljevic, TTTech. Computertechnik AG; Janice Meraglia, Applied Dna Sciences Inc.

An Overview of Historical Trends Related to Suspect Counterfeit and Nonconforming or High Risk Electronic Components in the Global Supply Chain
Mark A. Snider, ERAI Inc.

Risk Mitigation of Sophisticated Counterfeit ICs Using Cost Effective Electrical Testing Techniques
Sultan Ali Lilani, Integra Technologies LLC

Current Status of Various Industry Standards for Mitigating Counterfeits
Sultan Ali Lilani, Integra Technologies LLC

The Art of Affordable Counterfeit Mitigation
Stanley H. Salot, Ecc Corp.

Counterfeiting, Supply Chain Security, and the Cyber Threat: Why Defending Against Counterfeit Electronics is no Longer Enough
Janice Meraglia, Mitchell Miller, Applied DNA Sciences Inc.

Material Identification based Counterfeit Risk Assessment
Diganta Das, Univ. of Maryland

Development of Guidelines for Use of Electron (EEEE) Devices Subjected to Long Term Storage
Karl Strauss, Jet Propulsion Laboratory

View Technical Sessions Schedule