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This document establishes a method for characterizing the design margins and compatibility of electronic devices and equipment used in vehicles to various voltage fluctuations and transients over temperature.

This document establishes methods for characterizing the robustness of vehicle electronic modules to certain environmental stresses. They include: Voltage-Temperature Design Margins Voltage Interruptions-Transients Over Temperature Voltage Dips Current Draw Under a Number of Conditions These methods can be applied during Development, Pre-Qualification, Qualification or for Conformity. This document does not address other environmental robustness stresses such as vibration, high temp exposure, load faults, ESD, etc.

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g. Pre-Qualification, Qualification or Conformity).

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).