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This SAE Standard defines a method for evaluating the immunity of automotive electrical/electronic devices to radiated electromagnetic fields coupled to the vehicle wiring harness. The method, called Bulk Current Injection (BCI), uses a current probe to inject RF onto the wiring harness in the frequency range of 1 to 400 MHz. BCI is one of a number of test methods that can be used to simulate the electromagnetic field.

This part of SAE J1113 specifies the direct RF power injection test method and procedure for testing electromagnetic immunity of electronic components for passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J1113 are limited to continuous, narrowband conducted RF energy. This test method is applicable to all DUT leads except the RF reference ground. The test provides differential mode excitation to the DUT. Immunity measurements of complete vehicles are generally only possible by the vehicle manufacturer. The reasons, for example, are high costs of a large absorber-lined chamber, preserving the secrecy of prototypes or the large number of different vehicle models. Therefore, for research, development, and quality control, a laboratory measuring method for components shall be applied by the manufacturer. This method is suitable over the frequency range of 250 kHz to 400 MHz.

This document establishes a method for characterizing the design margins and compatibility of electronic devices and equipment used in vehicles to various voltage fluctuations and transients over temperature.

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).

This SAE Standard establishes a common basis for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Four test methods are presented – Capacitive Coupling Clamp, Chattering Relay, Direct Capacitor Coupling, and Inductive Coupling Clamp.

This SAE Standard establishes test methods for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test methods demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Four test methods are presented in SAE J1113-12: the capacitive coupling clamp (CCC) method the direct capacitive coupling (DCC) method the inductive coupling clamp (ICC) method the capacitive/inductive coupling (CIC) method

This SAE Standard establishes test methods for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test methods demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Four test methods are presented in SAE J1113-12: the capacitive coupling clamp (CCC) method the direct capacitive coupling (DCC) method the inductive coupling clamp (ICC) method the capacitive/inductive coupling (CIC) method