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Automotive electronics penetration in commercial vehicle segment, in India and other developing countries is in a primitive stage. Introducing a new technology into automobile applications may involve unpredictable failure modes, imposing several risks on the OEM (acronyms are mentioned in the last section) and causing financial losses. Low failure rates can only be achieved by rigorous testing before the product launch. This will help to achieve the required safety and reliability at the system level. The conventional method of testing has some drawbacks. This paper briefs on an advanced testing methodology, as well as a low cost system using telemetry for a trip-information computing unit. It also brings out the merits and demerits on using this system compared to conventional testing as well as other sophisticated testing systems. Towards the end, the paper proposes an alternate testing method and also relevant future works in this domain.