Search Results

"Effective particle or domain size" is a phrase used in X-ray diffraction literature to describe the size of the coherent regions within a material which are diffracting. Coherency in this sense means diffracting as a unit. Small particle size causes X-ray line broadening and as such can be measured. It has been shown related to substructure as observed in transmission electron microscopy. Particle size is affected by hardening, cold working, and fatigue; conversely, there is increasing evidence that particle size, per se, affects both static and dynamic strength.

This SAE recommended practice provides some procedure for determining shot peening coverage and relating coverage to part exposure to the media stream. Effectiveness of shot peening is directly dependent on coverage. Either incomplete or excessive coverage can be detrimental to fatigue strength and life.

This SAE Recommended Practice provides procedures for determining shot peening coverage and relating coverage to part exposure to the media stream. Effectiveness of shot peening is directly dependent on coverage. Inadequate or excessive coverage can be detrimental to fatigue strength and component life.

This SAE standard defines requirements for equipment and supplies to be used in measuring shot peening arc height and other surface enhancement processes. Guidelines for use of these items can be found in SAE J443 and SAE J2597.

This SAE Recommended Practice defines requirements for equipment and supplies to be used in measuring shot peening arc height and other surface enhancement processes. It is intended as a guide toward standard practice and is subject to change to keep pace with experience and technical advances. Guidelines for use of these items can be found in SAE J443 and SAE J2597.

This SAE standard defines requirements for equipment and supplies to be used in measuring shot peening arc height and other surface enhancement processes. Guidelines for use of these items can be found in SAE J443 and SAE J2597.