SAE 2014 World Congress & Exhibition

Technical Session Schedule

Wednesday, April 9

Hardware-in-the-Loop Technology for Embedded Software Development and Testing
(Session Code: AE108)

Room 332  8:00 a.m.

Developing automotive electronic controls and embedded software is a complex undertaking. In addition to Hardware-in-the-Loop simulation, improvements in desktop computing technology show promise for early verification of embedded software using a virtual environment for electronic control units and the test infrastructure. This session highlights advances in processes, tools, and technologies to reduce design and validation time and cost, and to improve the quality of embedded software.

Organizers - Kevin Kott, Vivek Moudgal, dSPACE Inc.; Peter Waeltermann, dSPACE GmbH

Time Paper No. Title
8:00 a.m. 2014-01-0188
Model-Based Real-Time Testing of Embedded Automotive Systems
Pawel Skruch, Gabriel Buchala, Delphi Automotive
8:20 a.m. 2014-01-0190
Timing Analysis and Tracing Concepts for ECU Development
Karsten Schmidt, Audi Electronics Venture GmbH; Jens Harnisch, Infineon Technologies AG; Denny Marx, Audi Electronics Venture GmbH; Albrecht Mayer, Infineon Technologies AG; Andre Kohn, Audi Electronics Venture GmbH; Reinhard Deml, Infineon Technologies AG
8:40 a.m. ORAL ONLY
Virtual ECUs as the Basis for an Interdisciplinary Validation Strategy
Karsten Kr├╝gel, dSPACE GmbH; David Wybo, dSPACE Inc.
9:00 a.m. 2014-01-0193
Design and Application of the ECU Application Software Components Library for Diesel Engine
Huan Li, Ying Huang, Xiaoyan Dai, Meiqi Hu, Beijing Institute of Technology
9:20 a.m. 2014-01-0191
Methodology for Migration of Traditional Application Software to AUTOSAR Architecture
Raghavendra Anantharam, Prakash Kulkarni, KPIT Infosystems Inc.
9:40 a.m. 2014-01-0194
A Real-Time Virtual Simulation Environment for Advanced Driver Assistance System Development
Fei Han, Weiwen Deng, Sumin Zhang, Jian Wu, Yu Wang, State Key Lab of Automotive Simulation & Control, Jilin Univ; Bin Liu, Bingxu Shang, Shaobo Qiu, R&D Center, China FAW Group

Planned by Testing and Instrumentation Committee / Automobile Electronics Activity