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G-19ATest Laboratory Standards Development Committee
| Project |
Title |
Sponsor |
Date |
| AS6171 |
Test Methods Standard; Counterfeit Electronic Parts |
Dan DiMase |
Dec 13, 2010 |
| AS6171/1 |
External Visual Inspection (EVI) AS6171 Test Method I |
Anne Poncheri |
Mar 15, 2013 |
| AS6171/II |
AS6171/II - TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS BY X-RAY FLUORESCENCE TEST METHODS |
Diganta Das |
May 30, 2013 |
| AS6171/III |
Delid/Decapsulation Physical Analysis (DDPA) for Counterfeit Part Detection |
Erik Jordan |
Apr 02, 2013 |
| AS6171/V |
AS6171/V - Techniques for Suspect/Fraudulent/Counterfeit EEE Parts Detection of Plastic Encapsulated Microcircuits (PEMS) by Accoustic Microscopy (AM) Test Methods - Test Method V |
Steven Martell |
Mar 15, 2013 |
| AS6171/VI |
AS6171/VI - Techniques for Suspect/Fraudulent/Counterfeit EEE Parts Detection by Electrical Test Methods - Test Method VI |
Sultan Ali Lilani |
Mar 25, 2013 |
| AS6171/VIIE |
Technique for Suspect/Counterfeit EEE Parts Detection by Raman Spectroscopy |
Michael Azarian |
May 30, 2013 |
| AS6171/VIIF |
Technique for Suspect/Counterfeit EEE Parts Detection by Fourier Transform Infrared Spectroscopy (FTIR) Test Method |
Michael Azarian |
May 30, 2013 |
| AS6171/VIIM |
AS6171/VIIm - Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods |
Michael Azarian |
Apr 25, 2013 |
| AS6171/VIIj |
Technique for Suspect/Counterfeit EEE Parts Detection by Thermogravimetric Analysis (TGA) Test Method |
Michael Azarian |
Jun 17, 2013 |
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