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G-19A Test Laboratory Standards Development Committee


Works in Progress
Project Title Sponsor Date
AS6171 Test Methods Standard; Counterfeit Electronic Parts Dan DiMase Dec 13, 2010
AS6171/1 External Visual Inspection (EVI) AS6171 Test Method I Anne Poncheri Mar 15, 2013
AS6171/II TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS BY X-RAY FLUORESCENCE TEST METHODS Diganta Das May 30, 2013
AS6171/III Delid/Decapsulation Physical Analysis (DDPA) for Counterfeit Part Detection Erik Jordan Apr 02, 2013
AS6171/IV Method IV - TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS Bhanu Pratap Sood Jul 02, 2013
AS6171/TE Suspect/Counterfeit Detection Test Evaluation Method Michael Megrdichian Jun 19, 2014
AS6171/V Techniques for Suspect/Fraudulent/Counterfeit EEE Parts Detection of Plastic Encapsulated Microcircuits (PEMS) by Accoustic Microscopy (AM) Test Methods - Test Method V Steven Martell Mar 15, 2013
AS6171/VI Techniques for Suspect/Fraudulent/Counterfeit EEE Parts Detection by Electrical Test Methods - Test Method VI Sultan Ali Lilani Mar 25, 2013
AS6171/VIIE Technique for Suspect/Counterfeit EEE Parts Detection by Raman Spectroscopy Michael Azarian May 30, 2013
AS6171/VIIF Technique for Suspect/Counterfeit EEE Parts Detection by Fourier Transform Infrared Spectroscopy (FTIR) Test Method Michael Azarian May 30, 2013
AS6171/VIIM Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods Michael Azarian Apr 25, 2013
AS6171/VIIj Technique for Suspect/Counterfeit EEE Parts Detection by Thermogravimetric Analysis (TGA) Test Method Michael Azarian Jun 17, 2013