SAE International
SAE Standards Works
SAE International
Contact Us | Help | Shopping Cart
SAE Login

AS6171/II - TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS BY X-RAY FLUORESCENCE TEST METHODS

Details
Not available for purchase at this time.
Document Number: AS6171/II
Project Initiation: 05-30-2013
Project Number:
Revision Number:
Sponsor Name: Diganta Das
Title
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS BY X-RAY FLUORESCENCE TEST METHODS
Scope
XRF technique for counterfeit detection is applicable to electronic and other parts as listed in the AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts.
Rationale
Since counterfeit electronics components are likely to have some level of material difference from the genuine components, techniques that identify the chemical elements in different areas of a part are essential to benchmarking authentic parts and comparing them to parts under consideration. X-ray fluorescence (XRF) is one such technique that can be applied both to the external surfaces and internal elements of a part. The method itself is non-destructive by nature.
Recent Activity
DateType