SAE Standards Works
G-19A Test Laboratory Standards Development Committee
AS6171/IV - Method IV - TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
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Bhanu Pratap Sood
Method IV - TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
The intent of this document is to define the methodology for suspect parts inspection using radiological inspection. The purpose of radiology for suspect counterfeit part inspection is to detect deliberate misrepresentation of a part, either at the part distributor or OEM level. Radiological inspection can also potentially detect unintentional damage to the part resulting from improper removal of part from assemblies, which may include, but not limited to, prolonged elevated temperature exposure during desoldering operations or mechanical stresses during removal. Radiological inspection of electronics includes film radiography and filmless radiography such as digital radiography (DR), real time radiography (RTR), and computed tomography (CT). Radiology is an important tool used in part authentication of microelectronic devices. Radiographic analysis is performed on parts to verify that the internal package or die construction is consistent with an exemplar item. In case an exemplar item is not available, comparisons should be made within a homogeneous sample population using the technical data available for that item.
Radiological inspection is a means to inspect the internal attributes of an electronic device. The inspection process is, for the most part, non-destructive, however, it had been demonstrated that the radiological inspection process can be destructive for certain device types. Radiological inspection allows for expeditious inspection and detection of anomalies of numerous devices.