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AS6171/V - Techniques for Suspect/Fraudulent/Counterfeit EEE Parts Detection of Plastic Encapsulated Microcircuits (PEMS) by Accoustic Microscopy (AM) Test Methods - Test Method V

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Document Number: AS6171/V
Project Initiation: 03-15-2013
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Sponsor Name: Steven Martell
Title
Techniques for Suspect/Fraudulent/Counterfeit EEE Parts Detection of Plastic Encapsulated Microcircuits (PEMS) by Accoustic Microscopy (AM) Test Methods - Test Method V
Scope
Through the use of ultra-high frequency ultrasound, typically above 10 MHz, Acoustic Microscopy (AM) non-destructively finds and characterizes physical features and latent defects (visualization of interior features in a layer by layer process) — such as material continuity, sub-surface flaws, cracks, voids, delaminations and porosity. AM observed features and defects can be indicators that the components were improperly handled, stored, altered or previously used.
Rationale
The purpose of this document is to provide recommended techniques and guidelines for the use of Acoustic Microscopy for detection of counterfeit electronic components.
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