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AS6171/VIIF - Technique for Suspect/Counterfeit EEE Parts Detection by Fourier Transform Infrared Spectroscopy (FTIR) Test Method

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Document Number: AS6171/VIIF
Project Initiation: 05-10-2013
Project Number: AS6171/VIIf
Revision Number: F
Sponsor Name: Michael Azarian
Title
Technique for Suspect/Counterfeit EEE Parts Detection by Fourier Transform Infrared Spectroscopy (FTIR) Test Method
Scope
This document defines capabilities and limitations of FTIR as it pertains to counterfeit electronic component detection and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of FTIR including: operator training, sample preparation, various sampling techniques, data interpretation, computerized spectral matching including pass/fail criteria, equipment maintenance, and reporting of data. The discussion is primarily aimed at analyses performed in the mid-infrared (IR) from 400 to 4000 wavenumbers; however, many of the concepts are applicable to the near and far IR.
Rationale
This document was created to provide guidance for those unfamiliar with Fourier Transform Infrared (FTIR) spectroscopy towards its application of counterfeit detection of electronic components. Additionally, this document is intended to provide guidelines for the application of FTIR and to define the compliance requirements for laboratories using this technique.
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