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AS6171/VIIM - Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods

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Document Number: AS6171/VIIM
Project Initiation: 04-25-2013
Project Number:
Revision Number: M
Sponsor Name: Michael Azarian
Title
Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
Scope
This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery to the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching including pass/fail criteria; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data.
Rationale
This document was created to provide guidelines for the application of Design Recovery and to define the compliance requirements for laboratories using this technique. Additionally this document is intended to provide guidance for those unfamiliar with Design Recovery and its application to detection of counterfeit electronic parts. This technique can be used for any risk level as needed to support results from other analysis techniques.
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