Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
J1752/1_201605
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
Rationale:
The technical revisions to this standard include updating the description of the IC test printed circuit board and providing for larger size test boards to accommodate larger IC packages. References and background information have also been updated.
Related Topics:
Emissions measurement
Electromagnetic compatibility
Integrated circuits
Environmental testing
Semiconductor devices
Test procedures
Emissions certification
Suppliers
Also known as: SAE J 1752/1
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