Photon-Induced Positron Annihilation (Pipa)-A New, Core Technology to Improve the Nondestructive Inspection and Life Prediction for Critical Components

Document Number: 2002-01-3000

Date Published: November 2002

Author(s):
Doug Akers - Positron Systems Inc.
Scott J. Ritchie - Positron Systems Inc.

Abstract:
A new patented technology, Photon-Induced Positron Annihilation (PIPA) has been developed that provides the capability to nondestructively detect fatigue, corrosion- induced fatigue, radiation and embrittlement damage at \ml 1% of fatigue life. Further, PIPA can accurately assess defect levels and predict the remaining life of various metallic, composite, and polymeric materials. PIPA has demonstrated the capability to detect damage in 2nd layer materials, without disassembly. PIPA is insensitive to surface geometries and anomalies such as paint or rust. Because PIPA detects fatigue and embrittlement at the atomic level, the PIPA process is directly applicable to detecting the fatigue and manufacturing defect issues pertinent to composite and metallic alloy components used in the aerospace industry.

File Size: 208K
Product Status: In Stock

See other papers presented at World Aviation Congress _® & Display, November 2002, Phoenix, AZ, USA, Session: Fracture / Fatigue

Purchase more technical papers and save! With TechSelect, you decide what SAE Technical Papers you need, when you need them, and how much you want to pay. Learn more >