Estimation Fo Spectral Response of Surface Materials Through Measurement of Temperature Dependence of Total Hemispherical Emittance

Document Number: 981549

Date Published: July 1998

Author(s):
Tomonao Hayashi - Chiba Institute of Technology
Akira Ohnishi - Institute of Space Astronautical Science

Abstract:
A method is proposed to estimate a spectral response of surface materials through experimental data of temperature dependence of total hemispherical emittance. This method is applied to experimental data obtained for poly-imide films with four different kinds of thickness, and the results of their spectral response estimated are shown.

File Size: 216K
Product Status: In Stock

See other papers presented at International Conference On Environmental Systems, July 1998, Danvers, MA, USA, Session: Unmanned Spacecraft Thermal Design and Technology

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