Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions
J1752/1_200610
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
Rationale:
The intent of this document is to define general test conditions to establish a uniform testing environment and obtain a quantitative measure of the RF emissions from ICs. Critical parameters that are expected to influence the test results are described in this document and any deviations shall be documented in the test report. This revision is being implemented to support advances in the individual; test methods.
Related Topics:
Emissions measurement
Environmental testing
Electromagnetic compatibility
Integrated circuits
Semiconductor devices
Test procedures
Emissions certification
Also known as: SAE J 1752/1
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