Browse Publications Technical Papers 2000-01-3010
2000-09-19

Precision Location of Hidden Edges in Manufacturing Using a Compact X-ray Backscatter Gauge 2000-01-3010

A compact x-ray backscatter gauge has been developed to detect hidden edges of substructure and precisely determine edge distances prior to drilling. The portable system can be mounted at the drill for automated operation or used as a hand-held unit for manual operation. The gauge requires access to only one side of the assembly and can operate either in contact with the surface or held off the surface by as much as 10 mm. The system is capable of locating edges hidden under either a metallic or composite skin and maintaining edge distance tolerances within approximately a quarter of a mm.

SAE MOBILUS

Subscribers can view annotate, and download all of SAE's content. Learn More »

Access SAE MOBILUS »

Members save up to 43% off list price.
Login to see discount.
Special Offer: With TechSelect, you decide what SAE Technical Papers you need, when you need them, and how much you want to pay.
X