Photon Induced Positron Annihilation (PIPA)—A New, Core Technology to Improve the Nondestructive Inspection and Life Prediction for Critical Components 2002-01-3000
A new patented technology, Photon Induced Positron Annihilation (PIPA) has been developed that provides the capability to nondestructively detect fatigue, corrosion induced fatigue, radiation and embrittlement damage at < 1% of fatigue life. Further, PIPA can accurately assess defect levels and predict the remaining life of various metallic, composite, and polymeric materials. PIPA has demonstrated the capability to detect damage in 2nd layer materials, without disassembly. PIPA is insensitive to surface geometries and anomalies such as paint or rust. Because PIPA detects fatigue and embrittlement at the atomic level, the PIPA process is directly applicable to detecting the fatigue and manufacturing defect issues pertinent to composite and metallic alloy components used in the aerospace industry.
Citation: Akers, D. and Ritchie, S., "Photon Induced Positron Annihilation (PIPA)—A New, Core Technology to Improve the Nondestructive Inspection and Life Prediction for Critical Components," SAE Technical Paper 2002-01-3000, 2002, https://doi.org/10.4271/2002-01-3000. Download Citation
Douglas W. Akers, Scott J. Ritchie
World Aviation Congress & Exposition
SAE 2002 Transactions Journal of Aerospace-V111-1