Understanding Particulate Contaminants via Automated Electron Beam Analysis 2004-01-1337
Particulate contaminants are an important concern in today's precision automotive assemblies. Whether driven by quality, cost, or performance considerations understanding the source and impact of particles requires detailed knowledge of their distribution in size and composition. Particle-by-particle measurement of filtered material is today conducted automatically by computer-operated microscope systems. When an optimized electron beam analysis tool performs such automated microscopic examination it provides not only distributions of particulate material by size and shape, but also accurate classification by composition. Detailed images of individual particles are also readily obtained and can be a great aid to source evaluation.
Citation: Schamber, F. and van Beek, C., "Understanding Particulate Contaminants via Automated Electron Beam Analysis," SAE Technical Paper 2004-01-1337, 2004, https://doi.org/10.4271/2004-01-1337. Download Citation
Author(s):
Frederick H. Schamber, Cornelis G. van Beek
Affiliated:
ASPEX, LLC
Pages: 14
Event:
SAE 2004 World Congress & Exhibition
ISSN:
0148-7191
e-ISSN:
2688-3627
Also in:
Testing and Instrumentation 2004-SP-1871
Related Topics:
Particulate matter (PM)
Logistics
Optimization
Imaging and visualization
Tools and equipment
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