Development of Advanced Finite Element Models of World SID 5th and 50th — The Next Generation Side Impact Dummies 2007-01-0891
This paper describes the development of new advanced Finite Element (FE) models of the World SID series, namely World SID 50th and 5th, the new generation of side impact Anthropomorphic Test Devices (ATD). The model development follows the FTSS's rigorous quality assurance (QA) procedure and uses the manufacture's product data and test facilities extensively. The models are validated at material, component & assembly, full dummy certification and sled test application levels. A detailed modeling methodology is described.
The models correlate well with both the component and whole dummy level test results.
Citation: Liu, Y., Zhu, F., Wang, Z., and van Ratingen, M., "Development of Advanced Finite Element Models of World SID 5th and 50th — The Next Generation Side Impact Dummies," SAE Technical Paper 2007-01-0891, 2007, https://doi.org/10.4271/2007-01-0891. Download Citation
Yi Liu, Fuchun Zhu, Zhenwen Wang, Michiel van Ratingen
First Technology Safety Systems, Inc
SAE World Congress & Exhibition
CAD/CAM/CAE Technology, Digital Modeling, Virtual Development and Engineering-SP-2072, SAE 2007 Transactions Journal of Passenger Cars: Mechanical Systems-V116-6