Portable IR Emittance Measurement System for Spacecraft Thermal Design and Quality Control 2007-01-3124
This paper reports a development of a εH measurement system. The system has been evaluated by comparing the measurement data with the data, which were obtained by conventional reliable techniques in the laboratory. From the evaluation results it was confirmed that the measurement accuracies of the present systems is Δε = ±0.05. Now this system is being improved for higher measurement accuracy, and it will be commercialized in 2007.