Universal Synaptics - Aging Electronics, Intermittence, & No Fault Found 2019-01-1889

Intermittence occurs randomly in time, place, amplitude and duration. The very nature of the failure mode suggests that the ability to detect and further isolate the intermittence root cause is based on detection SENSITIVITY and PROBABILITY rather than conventional methods concentrating on ohmic measurement accuracy. Simply put, you can’t detect an intermittent event until it occurs, and then you might have limited opportunities to catch it on the specific circuit when it does. Trying to measure fractions of a milliohm, scanning one circuit at a time, is ineffective for this particular failure mode. In this paper we will outline the problem of intermittence and its testing difficulties. More importantly, we will describe the unique equipment and process which has produced overwhelming success in Intermittence / NFF resolution and MTBF extension. Working with Total Quality Systems, (TQS) Ogden, Utah, we implemented our team-developed overhaul system called IFDIS (Intermittent Fault Detection and Isolation System) which incorporates all the necessary testing procedures and technological capabilities that are proving to be critical to the resolution of the chronic intermittent / NFF problem.