Exploration of Support Methods for Tradespace Exploration 2023-01-0117
Tradespace exploration (TSE) is an important aspect of the early stages of the design process, in which stakeholders search for the most optimal solutions within a design variable-bounded solution space. This decision-making process requires stakeholders to understand the trade-offs and compromises that may be required to choose a solution. In order for stakeholders to make these decisions appropriately, information must be presented in an efficient manner and should ensure that the trade-offs between solutions are clearly visible. Existing visualizations often struggle to elucidate these trade-offs, and can rapidly become difficult to understand as the dimensionality of the tradespace increases. In this paper, the benefits and drawbacks to these existing methods will be discussed. In addition, this paper will explore potential methods to improve information presentation for TSE, including framing, visual steering, and visualization options. A three-phase study plan is then proposed to determine the effects of implementing these suggested improvements. The three phases of this study include various degrees of technological intervention with regard to how the tradespace is represented, including morphological charts, radar plots, and virtual reality-supported hyper-dimensional plots.
Citation: Sutton, M., Wagner, J., Turner, C., Hartman, G. et al., "Exploration of Support Methods for Tradespace Exploration," SAE Technical Paper 2023-01-0117, 2023, https://doi.org/10.4271/2023-01-0117. Download Citation
Author(s):
Meredith Sutton, John Wagner, Cameron Turner, Gregory Hartman, David Gorsich, Annette Skowronska, Stephen Rapp
Affiliated:
Clemson University, US Army GVSC, US Army Futures Command
Pages: 8
Event:
WCX SAE World Congress Experience
ISSN:
0148-7191
e-ISSN:
2688-3627
Related Topics:
Design processes
Imaging and visualization
Research and development
Radar
Frames
SAE MOBILUS
Subscribers can view annotate, and download all of SAE's content.
Learn More »