1972-02-01

Equipment and Methods of X-Ray Stress Analysis 720242

The measurement of stress by x-ray diffraction techniques is considered from both the technical and practical viewpoints. Basic principles are discussed and the techniques and x-ray instrumentation presently in use here and abroad are described and compared from the standpoints of accuracy, precision, and time required for stress determination. Both diffractometer and film or camera techniques are covered. Other factors discussed are alignment requirements, selection of optimum instrumental conditions, required corrections to raw diffractometer data, specimen surface preparation, and stress constant evaluation methods.
Step-by-step procedures for the novice with illustrations of typical data and calculations are finally presented for the two exposure and sin2ψ diffractometer techniques and for the two-exposure camera method.

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