Digital and Analog Filters for Processing Impact Test Data

James K. Reichert; Jack P. Landolt

doi:10.4271/810813

1981-06-01

Digital and Analog Filters for Processing Impact Test Data 810813

A set of digital and analog low-pass filters, which meet specific data-processing criteria for impact testing, are described. The design, implementation and performance of the filters are discussed. These digital filters exhibit finite-impulse- and linear-phase-shift response characteristics. They were designed using the Remez exchange algorithm. The active analog filters, which exhibit a near linear, phase shift, Bessel response, were developed using commercially-available integrated circuits. These filters have the frequency-and channel-class characteristics advocated by the Society of Automotive Engineers in their publication “S.A.E. Recommended Practice J211b, Instrumentation for Impact Tests”.

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Digital and Analog Filters for Processing Impact Test Data 810813

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