The Defection of Emission Related Defects on Future Vehicles - Which Assembly Line Test Is Most Effective? 810841
A test program using thirty production 1980 California “X” cars equipped with Computer Command Control emission control systems was run to compare the emission-related defect detection ability of end-of-line short emission tests and non-emission (or functional) tests. In this comparison, the non-emission tests detected 91% of the defects implanted, while the short emission tests detected only 64% of the defects. Further development of non-emission tests would further improve their defect detection capability, while little can be done to improve the defect detection capability of short emission tests.
Citation: Calhoun, J., Drake, D., Blass, G., Mirkhani, K. et al., "The Defection of Emission Related Defects on Future Vehicles - Which Assembly Line Test Is Most Effective?," SAE Technical Paper 810841, 1981, https://doi.org/10.4271/810841. Download Citation
J. C. Calhoun, D. A. Drake, G. F. Blass, K. Mirkhani, E. J. Roelant
Environmental Activities Staff General Motors Corp., Manufacturing Development Staff General Motors Corp.
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