Microprocessor Based Pressure Measurement Instrumentation: The Technology and Applications 920910

This paper describes in detail the development and the technology of multi-channel, high scan rate, and high accuracy pressure measurement instrumentation. The discussion is chronologically ordered and begins with the development of the Electronic Pressure Scanning (ESP) technology. The paper will detail this technology which is used to achieve high end results in many demanding applications. During this section, the paper will address the single crystal silicon diaphragm pressure transducers. The temperature and time characteristics as well as other properties of this transducer type will be evaluated. Other features of the ESP, such as multiplexing internal amplification, and full calibration ability will be described.
The focus is then on the systems approach to solving the measurement need from the transducers to the host computer. The systems discussion emphasizes the unique in-situ, fully pneumatic, transducer and system calibration. Such technologies as multi-tasking, parallel processing, and high speed data acquisition is also presented in order to fully describe the advanced state of the systems used for multi-channel pressure measurements.
The next phase of the paper introduces the latest trends and developments in the pressure measurement industry. This discussion includes topics such as Smart Transducers, technological adjustment to achieve cost reductions, and new interfacing techniques to facilitate increased user friendliness.
Finally, some applications of this technology are described.


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