1992-08-03

SAFT Nickel-Cadmium Lifetime and Reliability 929327

The first part of this document gives the reliability number for SAFT cells. This calculation covers the entire SAFT NiCd cell experience: on ground and on board satellites under LEO and GEO conditions. The second part describes a lifetime model. This model is based on a Weibull distribution and the Arrhenius law, taking into account the following parameters: Temperature, DOD, percentage of failed cells and overcharge current.

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