A Sampling and Conditioning Particle System for Solid Particle Measurements Down to 10 nm
The measurement of vehicle particle number emissions and, therefore, regulation, necessitates a rigorous sampling and conditioning technology able to deliver solid emitted particles with minimum particle losses. European legislation follows a solid particle number measurement method with cutoff size at 23 nm proposed by the Particle Measurement Programme (PMP). Accordingly, the raw exhaust is sampled with constant volume, subsequently passes through a volatile particle remover (VPR), and finally is measured with a particle counter. Lowering the 23 nm cutoff size with current VPR technologies introduces measurement uncertainties mainly due to the high particle losses and possible creation of artefacts. This study describes the development and evaluation of a sampling and conditioning particle system, the SCPS, specially designed for sub-23 nm solid particles measurement.