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Standard

Electrostatic Discharge Test for Vehicles

1995-07-01
CURRENT
J1595_199507
This SAE Information Report defines the test methods and specifications for electrostatic discharge sensitivity of passenger cars, multipurpose passenger vehicles, trucks and buses.
Standard

Electrostatic Discharge Test for Vehicles

1988-10-01
HISTORICAL
J1595_198810
This SAE Information Report defines the test methods and specifications for electrostatic discharge sensitivity of passenger cars, multipurpose passenger vehicles, trucks and buses.
Standard

Performance Levels and Methods of Measurement of Electromagnetic Radiation From Vehicles and Devices, Narrowband, 10 Khz to 1000 Mhz

1987-10-01
CURRENT
J1816_198710
With the advent of computer based electronics being utilized in automobiles, the Electromagnetic Radiation Subcommittee has deemed it prudent that a new test method be written to provide a common test for the measurement of narrowband radiation from vehicles and devices. This SAE Standard covers methods of measuring incidental narrowband radiation from vehicles and devices. The standard also establishes performance levels intended to protect nearby communication and broadcast receivers. It is intended to serve as an alternate method of measuring electromagnetic radiation which is analogous to the FCC Part 15 methodology but adapted to measuring vehicles. The equivalent procedures for broadband emissions are set forth in SAE J551. This standard covers narrowband emissions in the frequency range of 10 kHz to 1000 MHz. An example of such radiation is the unintended emission from on-board logic and computer modules.
Standard

Measurement of Radiated Emissions from Integrated Circuits -- Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2003-01-21
HISTORICAL
J1752/2_200301
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2011-06-24
HISTORICAL
J1752/2_201106
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2016-09-16
CURRENT
J1752/2_201609
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurement Procedures-General and Definition

1997-03-01
HISTORICAL
J1752/1_199703
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752. The near field magnetic of electromagnetic radiation from an integrated circuit can be measured in a controlled manner that yields repeatable results. These emissions are related to the far field electromagnetic radiation potential of the IC and of the electronic module of which it is a part. The intent is to provide a quantitative measure of the RF emissions from ICs for comparison or other purposes. Similar quantitative measures of the immunity of an IC to RF fields and transients are being investigated.
Standard

Vehicle Electromagnetic Radiated Susceptibility Testing Using a LargeTEM Cell

1995-07-01
CURRENT
J1407_199507
This information report gives the procedures for use and operation of a large transverse electromagnetic (TEM) mode cell for the determination of electromagnetic (EM) radiated susceptibility of equipment, subystems and systems (whose dimensions are less than 3 m x 6 m x 18 m) in the frequency range 10 kHz - 20 MHz. Several large TEM cells have been designed and constructed by various organizations for EMP and high power CW testing. Two cell designs and associated instrumentation are included for example purposes in this report. Other cell configurations have also been constructed. Users should consult the literature before undertaking a project of this magnitude for other cell and instrumentation designs.
Standard

Vehicle Electromagnetic Radiated Susceptibility Testing Using a Large Tem Cell

1988-03-01
HISTORICAL
J1407_198803
This information report gives the procedures for use and operation of a large transverse electromagnetic (TEM) mode cell for the determination of electromagnetic (EM) radiated susceptibility of equipment, subystems and systems (whose dimensions are less than 3 m x 6 m x 18 m) in the frequency range 10 kHz - 20 MHz. Several large TEM cells have been designed and constructed by various organizations for EMP and high power CW testing. Two cell designs and associated instrumentation are included for example purposes in this report. Other cell configurations have also been constructed. Users should consult the literature before undertaking a project of this magnitude for other cell and instrumentation designs.
Standard

Vehicle Electromagnetic Radiated Susceptibility Testing Using a LargeTEM Cell

1982-08-01
HISTORICAL
J1407_198208
This information report gives the procedures for use and operation of a large transverse electromagnetic (TEM) mode cell for the determination of electromagnetic (EM) radiated susceptibility of equipment, subystems and systems (whose dimensions are less than 3 m x 6 m x 18 m) in the frequency range 10 kHz - 20 MHz. Several large TEM cells have been designed and constructed by various organizations for EMP and high power CW testing. Two cell designs and associated instrumentation are included for example purposes in this report. Other cell configurations have also been constructed. Users should consult the literature before undertaking a project of this magnitude for other cell and instrumentation designs.
Standard

Anechoic Test Facility Radiated Susceptibility 20 MHz to 18 GHz Electromagnetic Field

1995-07-01
CURRENT
J1507_199507
This information report gives typical requirements for an anechoic chamber in which the system susceptibility of an operating motor vehicle to electromagnetic fields can be determined in the frequency range of 20 MHz to 18 GHz. Because of the large cone sizes required for 20 MHz cut-off, several anechoic facilities have been designed with lower cut-off frequencies of 200 MHz or greater. Testing below cut-off is then accomplished using customized antennas at reduced accuracy. Users should carefully review their testing requirements before undertaking the construction of a test facility the magnitude of an anechoic chamber. Other test approaches include, but are not limited to, open field testing per SAE J1338 and mode stirred reverberation chambers.
Standard

Anechoic Test Facility Radiated Susceptibility 20 Mhz - 18 Ghz Electromagnetic Field

1987-01-01
HISTORICAL
J1507_198701
This information report gives typical requirements for an anechoic chamber in which the system susceptibility of an operating motor vehicle to electromagnetic fields can be determined in the frequency range of 20 MHz to 18 GHz. Because of the large cone sizes required for 20 MHz cut-off, several anechoic facilities have been designed with lower cut-off frequencies of 200 MHz or greater. Testing below cut-off is then accomplished using customized antennas at reduced accuracy. Users should carefully review their testing requirements before undertaking the construction of a test facility the magnitude of an anechoic chamber. Other test approaches include, but are not limited to, open field testing per SAE J1338 and mode stirred reverberation chambers.
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