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This SAE Standard contains limits1 and procedures for the measurement of radio disturbances in the frequency range of 150 kHz to 1000 MHz. The standard applies to any electronic/electrical component intended for use in vehicles and large devices. Refer to International Telecommunications Union (ITU) Publications for details of frequency allocations. The limits are intended to provide protection for receivers installed in a vehicle from disturbances produced by components/modules in the same vehicle.2 The receiver types to be protected are: sound and television receivers3, land mobile radio, radio telephone, amateur and citizens' radio. For the purpose of this document, a vehicle is a machine which is self-propelled. Vehicles include (but are not limited to) passenger cars, trucks, agricultural tractors, and snowmobiles. The limits in this document are recommended and subject to modification as agreed between the vehicle manufacturer and the component supplier.

This part of SAE J1113 specifies test methods and procedures for testing electromagnetic immunity (of vehicle radiation sources) of electronic components for passenger cars and commercial vehicles. To perform this test method, the electronic module along with the wiring harness (prototype or standard test harness) and peripheral devices will be subjected to the electromagnetic disturbance generated inside an absorber-lined chamber. The electromagnetic disturbances considered in this part of SAE J1113 are limited to continuous narrowband electromagnetic fields. Immunity measurements of complete vehicles are generally only performed at the vehicle manufacturer. The reasons, for example, are high costs of a large absorber-lined chamber, preserving the secrecy of prototypes, or the large number of different vehicle models. Therefore, for research, development and quality control, a laboratory measuring method shall be applied by the manufacturers.

This SAE Standard defines a component-level test procedure to evaluate automotive electrical and electronic components for Conducted Emissions of transients, and for other electromagnetic disturbances, along battery feed (B+) or switched ignition inputs of a Device Under Test (DUT). Test apparatus specifications outlined in this procedure were developed for components installed in the 12-V passenger cars, light trucks, 12 V heavy-duty trucks, and vehicles with 24 V systems.

This SAE Standard defines a component-level test procedure to evaluate automotive electrical and electronic components for Conducted Emissions of transients, and for other electromagnetic disturbances, along battery feed (B+) or switched ignition inputs of a Device Under Test (DUT). Test apparatus specifications outlined in this procedure were developed for components installed in the 12-V passenger cars, light trucks, 12 V heavy-duty trucks, and vehicles with 24 V systems.

This SAE Standard covers the measurement of voltage transient immunity and within the applicable frequency ranges, audio (AF) and radio frequency (RF) immunity, and conducted and radiated emissions. By reference, ISO 11452-3, ISO 11452-7, ISO 11452-8, ISO 11452-10, ISO 11452-11, ISO 11452-2 and the emissions portion of ISO 7637-2 are adopted in place of SAE J1113-24, SAE J1113-3 , SAE J1113-22, SAE J1113-2, SAE J1113-28, SAE J1113-21 and SAE J1113-42, respectively. In the event that an amendment is made or a new edition is published, the new ISO document shall become part of this standard six months after the publication of the ISO document. SAE reserves the right to identify exceptions to the published ISO document with the exceptions to be documented in SAE J1113-24, SAE J1113-3, SAE J1113-22, SAE J1113-2, SAE J1113-28, SAE J1113-21 and SAE J1113-42 respectively. By reference, IEC CISPR 25 is adopted as the standard for the measurement of component emissions.

This SAE Standard covers the measurement of voltage transient immunity and within the applicable frequency ranges, audio (AF) and radio frequency (RF) immunity, and conducted and radiated emissions. By reference, ISO 11452-3, ISO 11452-7, ISO 11452-8, ISO 11452-10, ISO 11452-11, ISO 11452-2, and the emissions portion of ISO 7637-2 are adopted in place of SAE J1113-24, SAE J1113-3, SAE J1113-22, SAE J1113-2, SAE J1113-28, SAE J1113-21, and SAE J1113-42, respectively. In the event that an amendment is made, or a new edition is published, the new ISO document shall become part of this standard 6 months after the publication of the ISO document. SAE reserves the right to identify exceptions to the published ISO document with the exceptions to be documented in SAE J1113-24, SAE J1113-3, SAE J1113-22, SAE J1113-2, SAE J1113-28, SAE J1113-21, and SAE J1113-42, respectively. By reference, IEC CISPR 25 is adopted as the standard for the measurement of component emissions.

This SAE Standard covers the measurement of voltage transient immunity and within the applicable frequency ranges, audio (AF) and radio frequency (RF) immunity, and conducted and radiated emissions. By reference, ISO 11452-3, ISO 11452-7, ISO 11452-8, ISO 11452-10, ISO 11452-11, ISO 11452-2, and the emissions portion of ISO 7637-2 are adopted in place of SAE J1113-24, SAE J1113-3, SAE J1113-22, SAE J1113-2, SAE J1113-28, SAE J1113-21, and SAE J1113-42, respectively. In the event that an amendment is made, or a new edition is published, the new ISO document shall become part of this standard 6 months after the publication of the ISO document. SAE reserves the right to identify exceptions to the published ISO document with the exceptions to be documented in SAE J1113-24, SAE J1113-3, SAE J1113-22, SAE J1113-2, SAE J1113-28, SAE J1113-21, and SAE J1113-42, respectively. By reference, IEC CISPR 25 is adopted as the standard for the measurement of component emissions.

Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. The reverberation method is used to evaluate the immunity of electronic devices in the frequency range of 500 MHz to 2.0 GHz, with possible extensions to 200 MHz and 10 GHz, depending upon chamber size and construction. Optional pulse modulation testing at HIRF (High Intensity Radiated Fields) test levels, based upon currently known environmental threats, has been added to this revision of the standard. This document addresses the Mode Stir (Continuous Stirring) Reverberation testing method which has been successfully utilized as a design and production stage development tool for many years. The Mode Tuned (Stepped Tuner) Reverberation testing method is covered in the SAE J1113-28 document.

Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. The reverberation method is used to evaluate the immunity of electronic devices in the frequency range of 500 MHz to 2.0 GHz, with possible extensions to 200 MHz and 10 GHz, depending upon chamber size and construction. Optional pulse modulation testing at HIRF (High Intensity Radiated Fields) test levels, based upon currently known environmental threats, has been added to this revision of the standard. This document addresses the Mode Stir (Continuous Stirring) Reverberation testing method which has been successfully utilized as a design and production stage development tool for many years. The Mode Tuned (Stepped Tuner) Reverberation testing method is covered in the SAE J1113-28 document.

Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. The reverberation method is used to evaluate the immunity of electronic devices in the frequency range of 500 MHz to 2.0 GHz, with possible extensions to 200 MHz and 10 GHz, depending upon chamber size and construction. Optional pulse modulation testing at HIRF (High Intensity Radiated Fields) test levels, based upon currently known environmental threats, has been added to this revision of the standard. This document addresses the Mode Stir (Continuous Stirring) Reverberation testing method which has been successfully utilized as a design and production stage development tool for many years. The Mode Tuned (Stepped Tuner) Reverberation testing method is covered in the SAE J1113-28 document.

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.

This SAE Information Report defines a procedure for indicating the severity of narrowband emissions from an electronic system-component.

This SAE Information Report defines a procedure for indicating the severity of narrowband emissions from an electronic system-component.

This SAE Information Report defines a procedure for indicating the severity of narrowband emissions from an electronic system-component.

This document establishes a method for characterizing the design margins and compatibility of electronic devices and equipment used in vehicles to various voltage fluctuations and transients over temperature.

This document establishes methods for characterizing the robustness of vehicle electronic modules to certain environmental stresses. They include: Voltage-Temperature Design Margins Voltage Interruptions-Transients Over Temperature Voltage Dips Current Draw Under a Number of Conditions These methods can be applied during Development, Pre-Qualification, Qualification or for Conformity. This document does not address other environmental robustness stresses such as vibration, high temp exposure, load faults, ESD, etc.

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g. Pre-Qualification, Qualification or Conformity).

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).