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This SAE Information Report defines the test methods and specifications for the electrostatic discharge sensitivity of passenger cars, multipurpose passenger vehicles, trucks and buses.

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.

This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.

This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Standard specifies the test methods and procedures necessary to evaluate electrical components intended for automotive use to the threat of Electrostatic Discharges (ESDs). It describes test procedures for evaluating electrical components on the bench in the powered mode and for the packaging and handling non-powered mode. A procedure for calibrating the simulator that is used for electrostatic discharges is given in Appendix A. An example of how to calculate the RC Time Constant is given in Appendix B Functional Performance Status Classifications for immunity to ESD and Sensitivity classifications for ESD sensitive devices are given in Appendix C.

This SAE Standard specifies the test methods and procedures necessary to evaluate electrical components intended for automotive use to the threat of Electrostatic Discharges (ESDs). It describes test procedures for evaluating electrical components on the bench in the powered mode and for the packaging and handling non-powered mode. A procedure for calibrating the simulator that is used for electrostatic discharges is given in Appendix A. An example of how to calculate the RC Time Constant is given in Appendix B Functional Performance Status Classifications for immunity to ESD and Sensitivity classifications for ESD sensitive devices are given in Appendix C.

This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.

This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.