This SAE Standard covers the measurement of Impulse Electric Field Strength radiated over the frequency range of 20–1000 MHz from a vehicle or other device powered by an internal combustion engine or electric motor. Operation of all engines (main and auxiliary) on a vehicle or other device is included. All equipment normally operating when the engine is running is also included, except operator-controlled equipment, which is excluded. The recommended limit applies only to complete vehicles or devices in their final manufactured form. Vehicle mounted rectifiers used for battery charging in electric vehicles are included in this specification when operated in their charging mode.
This standard covers the measurement of impulsive electromagnetic radiation over the frequency range of 20–1000 MHz from a vehicle or other device powered by an internal combustion engine or electric motor. Operation of all engines (main and auxiliary) on a vehicle or other device is included. All equipment normally operating when the engine is running is also included, except operator-controlled equipment, which is excluded. The recommended limit applies only to complete vehicles or devices in their final manufactured form. Vehicle mounted rectifiers used for battery charging in electric vehicles are included in this specification when operated in their charging mode.
This standard covers the measurement of impulsive electromagnetic radiation over the frequency range of 20 to 1(100 MHz from a motor vehicle or other device powered by an internal combustion engine. Operation of all engines (main and auxiliary) on a vehicle or other device is included. All equipment normally operating when the engine is running is also included, except operator-controlled equipment, which is excluded. The recommended limit applies only to complete vehicles or devices in their final manufactured form.
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
This SAE Standard establishes a common basis for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Two test methods are presented - Coupling Clamp and Chattering Relay.
This SAE Standard establishes test methods for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test methods demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Four test methods are presented in SAE J1113-12: the capacitive coupling clamp (CCC) method the direct capacitive coupling (DCC) method the inductive coupling clamp (ICC) method the capacitive/inductive coupling (CIC) method
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.