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Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2011-06-24
HISTORICAL
J1752/2_201106
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2016-09-16
CURRENT
J1752/2_201609
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Vehicle Electromagnetic Immunity--On-Board Transmitter Simulation

1994-03-01
HISTORICAL
J551/12_199403
This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.
Standard

Vehicle Electromagnetic Immunity--On-Board Transmitter Simulation

1996-09-01
HISTORICAL
J551/12_199609
This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.
Standard

Vehicle Electromagnetic Immunity--On-Board Transmitter Simulation

2009-08-03
CURRENT
J551/12_200908
This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.
Standard

ELECTROMAGNETIC SUSCEPTIBILITY MEASUREMENT PROCEDURES FOR VEHICLE COMPONENTS (EXCEPT AIRCRAFT)

1987-08-01
CURRENT
J1113_198708
This SAE Recommended Practice establishes uniform laboratory measurement techniques for the determination of the susceptibility to undesired electromagnetic sources of electrical, electronic, and electromechanical ground-vehicle components. It is intended as a guide toward standard practice, but may be subject to frequent change to keep pace with experience and technical advances, and this should be kept in mind when considering its use.
Standard

Function Performance Status Classification for EMC Immunity Testing

2013-06-12
HISTORICAL
J1812_201306
This SAE Standard provides a general method for defining the acceptable function performance status classification for the functions of automotive electronic devices upon application of the test conditions specified as described in appropriate EMC immunity test standards (for example, SAE J1113 and SAE J551). Testing of devices could be performed either on or off vehicles. Appropriate test signal and methods, Function Performance status, and test signal severity level would have to be specified in the individual cases.
Standard

Function Performance Status Classification for EMC Immunity Testing

2018-09-13
CURRENT
J1812_201809
This SAE Standard provides a general method for defining the acceptable function performance status classification for the functions of automotive electronic devices upon application of the test conditions specified as described in appropriate EMC immunity test standards (for example, SAE J1113 and SAE J551). Testing of devices could be performed either on or off vehicles. Appropriate test signal and methods, Function Performance status, and test signal severity level would have to be specified in the individual cases.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2017-09-22
CURRENT
J1752/3_201709
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2011-06-17
HISTORICAL
J1752/3_201106
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Immunity to Radiated Electromagnetic Fields - Bulk Current Injection (BCI) Method

2014-04-25
HISTORICAL
J1113/4_201404
This SAE Standard defines a method for evaluating the immunity of automotive electrical/electronic devices to radiated electromagnetic fields coupled to the vehicle wiring harness. The method, called Bulk Current Injection (BCI), uses a current probe to inject RF onto the wiring harness in the frequency range of 1 to 400 MHz. BCI is one of a number of test methods that can be used to simulate the electromagnetic field.
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