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This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.

This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.

This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields.

This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.

This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.