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Standard

Test Device Head Contact Duration Analysis

2016-07-12
J2052_201607
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
Standard

Test Device Head Contact Duration Analysis

2011-01-05
J2052_201101
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
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