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The purpose of this standard is to provide a source of definitions of terms and acronyms commonly used in the air transport maintenance community for test and evaluation with an emphasis on terms applicable to BITE.

This presentation shows the SCADE System product line for systems modeling and generation based on the SysML standard and the Eclipse Papyrus open source technology. SCADE System has been developed in the framework of Listerel, a joint laboratory of Esterel Technologies, provider of the SCADE�, and CEA LIST, project leader of the Eclipse component, Papyrus. From an architecture point of view, the Esterel SCADE tools are built on top of the SCADE platform which includes both SCADE Suite�, a model-based development environment dedicated to critical software, and SCADE System enabling model-based system engineering. SCADE System includes Papyrus, an open source component (under EPL license), integrated in the modeling platform of Eclipse. Using this integrated modeling platform, both system and software teams share the same environment for system development. Furthermore, other model-based tools can be added to the environment, due to the use of Eclipse.

“Spotlight on Design” features video interviews and case study segments, focusing on the latest technology breakthroughs. Viewers are virtually taken to labs and research centers to learn how design engineers are enhancing product performance/reliability, reducing cost, improving quality, safety or environmental impact, and achieving regulatory compliance. Fuel efficiency, or simply put, how to get more mileage out of the same amount of fuel has become one of the main goals to be achieved by new automotive technologies in the future, thanks in part to new government regulations. In the episode “Fuel Efficiency: Racing toward CAFE 2025” (21:24) AVL engineers show simulation and testing being used to design more fuel efficient vehicles, including the equipment that actually analyzes fuel economy.

Enhanced License for Data Dictionary for Quantities Used in Cyber Physical Systems (AS6969B) allowing for greater usage as outlined in the terms of the Enhanced License. Terms can be reviewed prior to purchase once item is added to the cart. Data Dictionary for Quantities Used in Cyber Physical Systems (AS6969B) This data dictionary provides definitions for quantities commonly used in the command and control of cyber physical systems. It defines mathematical and logical terms, quantities, measurement units, reference systems, measurands, and measurements. It also defines common quantity modalities. The dictionary is structured to be convenient to data modelers. It is also extendable so that users can create their own quantity domains.

Enhanced License for Data Dictionary for Quantities Used in Cyber Physical Systems (AS6969) allowing for greater usage as outlined in the terms of the Enhanced License. Terms can be reviewed prior to purchase once item is added to the cart. Data Dictionary for Quantities Used in Cyber Physical Systems (AS6969) This data dictionary provides a mathematically coherent set of definitions for quantity types used in data models for unmanned systems. In this data dictionary, a quantity is defined as a property of a phenomenon, substance, or body whose value has magnitude.

Enhanced License and UML Model for Data Dictionary for Quantities Used in Cyber Physical Systems (AS6969) allowing for greater usage as outlined in the terms of the Enhanced License. Data Dictionary for Quantities Used in Cyber Physical Systems (AS6969A) This data dictionary provides definitions for quantities commonly used in the command and control of cyber physical systems. It defines mathematical and logical terms, quantities, measurement units, reference systems, measurands, and measurements. It also defines common quantity modalities. The dictionary is structured to be convenient to data modelers. It is also extendable so that users can create their own quantity domains.

The CDIF Family of Standards is primarily designed to be used as a description of a mechanism for transferring information between CASE tools. It facilitates a successful transfer when the authors of the importing and exporting tools have nothing in common except an agreement to conform to CDIF. The language that is defined for the Transfer Format also has applicability as a general language for Import/Export from repositories. The CDIF Integrated Meta-model defined for CASE also has applicability as the basis of standard definitions for use in repositories. The standards that form the complete family of CDIF Standards are documented in EIA/IS-106 CDIF - CASE Data Interchange Format - Overview. These standards cover the overall framework, the transfer format and the CDIF Integrated Meta-model. The diagram in Figure 1 depicts the various standards that comprise the CDIF Family of Standards. The shaded box depicts this Standard and its position in the CDIF Family of Standards.

The CDIF Family of Standards is primarily designed to be used as a description of a mechanism for transferring information between CASE tools. It facilitates a successful transfer when the authors of the importing and exporting tools have nothing in common except an agreement to conform to CDIF. The language that is defined for the Transfer Format also has applicability as a general language for Import/Export from repositories. The CDIF Integrated Meta-model defined for CASE also has applicability as the basis of standard definitions for use in repositories. The standards that form the complete family of CDIF Standards are documented in EIA/IS-106 CDIF - CASE Data Interchange Format - Overview. These standards cover the overall framework, the transfer format and the CDIF Integrated Meta-model. The diagram in Figure 1 depicts the various standards that comprise the CDIF Family of Standards. The shaded box depicts this Standard and its position in the CDIF Family of Standards.

This document explains how industry standard SAE AS5553 supports implementation of DFARS 252-246-7007 using a practical cost effective and risk based approach

Acoustic Microscopy Test Methods for Counterfeit Capacitors

The intent of this document is to define the methodology for suspect/counterfeit parts inspection using REME Analysis. The purpose of REME Analysis for suspect counterfeit part inspection is to detect misrepresentation or tampering of a part. REME Analysis can also potentially detect unintentional damage to the part resulting from improper removal of the part from assemblies, exposure to electrostatic discharge, exposure to radiation outside of acceptable limits (ionizing or high-power electromagnetic), or degradation. Improper removal of part from assemblies may include, but is not limited to, prolonged elevated temperature exposure during desoldering operations or mechanical stresses during removal. Degradation may include, but is not limited to, prolonged burn-in/testing, exposure to out-of-specification environmental conditions, or use outside of expected electrical tolerances.

Non-conformance and now Suspect counterfeit packaging represents a hazard to electrostatic discharge (ESD) sensitive devices or components through cross contamination during transport and storage while generating high voltage discharges to ESD sensitive devices during in shipping, the inspection process, handling and manufacturing. Several aerospace related issues involve long-term storage supplier non-conformance with antistatic foams, antistatic bubble, antistatic pink poly, vacuum formed antistatic polymers, Type I moisture barrier bags and Type III static shielding bags have posed issues. The late John Kolyer, Ph.D. (Boeing, Ret.) and Ray Gompf, P.E., Ph.D. (NASA-KSC, Ret.) were advocates in the utilization of a formalized physical testing material qualification process. Today, however, prime contractors and CMs rely heavily upon a visual inspection process for ESD packaging materials.

This document defines capabilities and limitations of LSM and CLSM as they pertain to suspect/counterfeit EEE part detection. Additionally, this document outlines requirements associated with the application of LSM and CLSM including: operator training, sample preparation, various imaging techniques, data interpretation, calibration, and reporting of test results. This test method is primarily directed to analyses performed in the visible to near infrared range (approximately 400nm to 1100nm). The Test Laboratory shall be accredited to ISO/IEC 17025 to perform the LSM and CLSM Test Methods as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 Scope statement, the specific method being accredited to: Option 1: All AS6171/17 Test Methods, or Option 2: All AS6171/17 Test Methods except CLSM. If SAE AS6171/17 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

This test method provides the capabilities, limitations, and suggested possible applications of TMA as it pertains to detection of suspect/counterfeit EEE parts. Additionally, this document outlines requirements associated with the application of TMA including: equipment requirements, test sample requirements, methodology, control and calibration, data analysis, reporting, and qualification and certification.

This document defines capabilities and limitations of Auger Electron Spectroscopy (AES) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of AES including: operator training and requirements; sample preparation; data interpretation and reporting of data.

This document defines capabilities and limitations of Gas Chromatography/Mass Spectrometry (GC/MS) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of GC/MS including: operator training; sample preparation; various sampling techniques; data interpretation; computerized spectral matching; equipment maintenance; and reporting of data. The discussion is limited to unit mass resolution spectrometers such as quadrupole systems and electron impact ionization.

To define capabilities and limitations of SEM-EDS as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of SEM-EDS including: Operator training; Sample preparation; Data interpretation; Equipment maintenance; and Reporting of data. If SAE AS6171/22 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

The intent of this test method is to describe high level processes to detect suspect/counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) Assemblies, covering both custom and military/commercial off-the-shelf (COTS) assemblies. This standard includes requirements for accreditation and certification of Laboratory and Laboratory personnel, and also, data collection, interpretation, and reporting as applicable to this test method. This standard covers EEE assemblies and includes electronic circuit card assemblies as defined under the definition for EEE Assembly and Electronic Circuit Card Assembly.

This document standardizes requirements for bearings: (a) supply chain management, procurement, inspection, parts management, and test/evaluation to assure the authenticity of bearings being acquired/used, and (b) response strategies when suspect or confirmed counterfeit bearings are discovered. Though developed primarily for critical application bearings, the document also may be applicable, at the discretion of the user, to other bearings with similar characteristics and applications. The bearings slash sheet is not intended to replace, conflict with, or duplicate requirements in quality system or AMS series material specs but rather to augment them with regards to counterfeit prevention and risk mitigation.