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Standard

Aerospace Qualified Electronic Component (AQEC) Requirements, Volume 1 - Integrated Circuits and Semiconductors

2015-03-09
CURRENT
GEIASTD0002_1A
This Standard applies to integrated circuits and semiconductors exhibiting the following attributes: a A minimum set of requirements, or information provided by the part manufacturer, which will allow a standard COTS component to be designated AQEC by the manufacturer. b As a minimum, each COTS component (designated AQEC) will have been designed, fabricated, assembled, and tested in accordance with the component manufacturer’s requirements for standard data book components. c Qualification of, and quality systems for, the COTS components to be designated as AQEC shall include the manufacturer’s standards, operating procedures, and technical specifications. d Components manufactured before the manufacturer has addressed AQEC requirements, but utilizing the same processes, are also considered AQEC compliant. e Additional desired attributes of a device designated AQEC (that will support AQEC users) are found in Appendix B of this standard.
Standard

Use of Semiconductor Devices Outside Manufacturers' Specified Temperature Ranges

2016-01-01
CURRENT
EIA4900
This document prescribes processes for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. It applies to any designer or manufacturer of equipment intended to operate under conditions tht require semiconductor devices to function in temperature ranges beyond those for which the devices are marketed. This document is intended for applications in which only the performance of the device is an issue. Even though the device is used at wider temperatures, the wider temperatures will be limited to those that do not compromise the system performance or application-specific reliability of the device in the application. Specifically, this document is not intended for applications that require the device to function at an operating or environmental stress level that significantly increases the risk of catastrophic device failure, loss of equipment function, or unstable operation of the device.
Standard

Processes for Application-Specific Qualification of Electrical, Electronic, and Electromechanical Parts and Sub-Assemblies for Use in Aerospace, Defense, and High Performance Systems

2016-11-18
CURRENT
ARP6379
This document describes a process for use by ADHP integrators of EEE parts and sub-assemblies (items) that have been targeted for other applications2. This document does not describe specific tests to be conducted, sample sizes to be used, nor results to be obtained; instead, it describes a process to define and accomplish application-specific qualification; that provides confidence to both the ADHP integrators, and the integrators’ customers, that the item will performs its function(s) reliably in the ADHP application.
Standard

Process for Assessment and Mitigation of Early Wearout of Life-limited Microcircuits

2015-12-06
HISTORICAL
ARP6338
This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the ADHP equipment to assess those designs and mitigations. This document focuses on the LLM wearout assessment process. It acknowledges that the ADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.
Standard

Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits

2019-02-08
CURRENT
ARP6338A
This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations. This document focuses on the LLM wearout assessment process. It acknowledges that the AADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.
Standard

Requirements for a COTS Assembly Management Plan

2019-04-22
WIP
EIA933C
This document applies to the development of Plans for integrating and managing COTS assemblies in electronic equipment and Systems for the commercial, military, and space markets; as well as other ADHP markets that wish to use this document.
Standard

Requirements for a COTS Assembly Management Plan

2015-03-01
CURRENT
EIA933B
This document applies to the development of Plans for integrating and managing COTS assemblies in electronic equipment and Systems for the commercial, military, and space markets; as well as other ADHP markets that wish to use this document. For purposes of this document, COTS assemblies are viewed as small electronic assemblies such as printed wiring assemblies, relays, disk drives, LCD matrices, VME circuit cards, servers, printers, laptop computers, etc. There are many ways to categorize COTS assemblies1, including the following spectrum: At one end of the spectrum are COTS assemblies whose design, internal parts2, materials, configuration control, and qualification methods are at least partially controlled, or influenced, by aerospace customers (either individually or collectively). An example at this end of the spectrum is a VME circuit card assembly.
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