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This paper describes a joint SAE automotive and aerospace Recommended Practice SAE J3168 now in development to standardize a process for Reliability Physics Analysis. This is a science-based approach to implement Physics-of-Failure research in conducting durability simulations in a Computer Aided Engineering Environment. It is used to calculate failure mechanism susceptibilities and estimate the likelihood of failure and the expected durability life of Electrical, Electronic and Electromechanical components and equipment, due to stresses such as mechanical shock, vibration, temperature cycling, etc. Reliability Physics Analysis is based on the material science principle of stress driven damage accumulation in materials. The process enables the identification of potential failure risks early in the design phase so that such risks can be designed out in order to efficiently design high reliable and robustness into electronic products.

In early design activities (typically before the hardware is built), a reliability prediction is often required for the electronic components and systems in order to assess their future reliability and in many cases to meet customer specifications. These specifications may include the allocated reliability for a particular electronic unit and in the cases of functional safety products to meet the ASIL (Automotive Safety and Integrity Level) requirement specified by the functional safety standard ISO 26262. The standard allows for the use of “statistics based on field returns or tests” as a valid alternative to the handbook-based reliability prediction. This paper presents a newly developed SAE-J3083 standard “Reliability Prediction for Automotive Electronics Based on Field Return Data”, which covers the types of the required data, ways to collect it, and the methodology of how to process this data to calculate the failure rates and meet the expected safety goals.