Precision Measurement of Deformation Using a Self-calibrated Digital Speckle Pattern Interferometry (DSPI)
A self-calibrating phase-shifting technique using a Michelson Interferometer is presented to measure phase distribution more accurately in Digital Speckle Pattern Interferometry (DSPI). DSPI is a well-established technique for the determination of whole field deformation via quantitatively measuring the phase distribution of speckle interferograms that use the phase shifting technique. In the phase shifting technique, the phase distribution in a speckle interferogram is quantitatively determined by recording multiple intensity images (usually four images) in which a constant phase shift, e.g. 90 degrees, is introduced between each consecutive image. A precise phase determination is greatly dependent on the accuracy of the phase shift introduced. The popular methods to minimize the error resulting from inaccurate phase shift use various algorithms and need to record five or eight images (rather than four images).