Refine Your Search

Topic

Author

Search Results

Standard

Counterfeit Materiel; Assuring Acquisition of Authentic and Conforming Materiel - Bearings

2020-04-21
WIP
AS6834
This document standardizes requirements for bearings: (a) supply chain management, procurement, inspection, parts management, and test/evaluation to assure the authenticity of bearings being acquired/used, and (b) response strategies when suspect or confirmed counterfeit bearings are discovered. Though developed primarily for critical application bearings, the document also may be applicable, at the discretion of the user, to other bearings with similar characteristics and applications. The bearings slash sheet is not intended to replace, conflict with, or duplicate requirements in quality system or AMS series material specs but rather to augment them with regards to counterfeit prevention and risk mitigation.
Standard

Techniques for Suspect/Counterfeit EEE Assembly Detection by Various Test Methods

2017-09-22
WIP
AS6171/23
The intent of this test method is to describe high level processes to detect suspect/counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) Assemblies, covering both custom and military/commercial off-the-shelf (COTS) assemblies. This standard includes requirements for accreditation and certification of Laboratory and Laboratory personnel, and also, data collection, interpretation, and reporting as applicable to this test method. This standard covers EEE assemblies and includes electronic circuit card assemblies as defined under the definition for EEE Assembly and Electronic Circuit Card Assembly.
Standard

Counterfeit and Substandard Battery Risk Mitigation

2018-07-24
WIP
AS7492
The Counterfeit and Substandard Battery Risk Mitigation sub-committee, G21B, is proposed with the goal of addressing the significant risk presented by counterfeit and substandard batteries. A standard similar to the SAE AS6171 Anti-counterfeit standard will provide inspection methods and risk mitigation strategies, to help mitigate the risk for the Aerospace and Defense industries, to the benefit of all.
Standard

Techniques for Suspect/Counterfeit EEE Parts Detection by Netlist Assurance Test Methods

2016-02-15
WIP
AS6171/16
Netlist Assurance Test Methods exist to assess microcircuit designs for maliciously added, removed, or modified functions detrimental to system operation. In the context of the Microcircuit fabrication design process, these methods will be used to analyze a computer aided design (CAD) representation of the microcircuit. The Netlist Assurance Test Methods discover vulnerabilities, undisclosed functions (e.g. "kill switch", paths to leak passwords, or triggers of malicious activity) and changes from the original specifications of the devices. These methods are intended to be used with standard verification methods that the implemented design has remained unchanged through the many transformations in the design flow.
Standard

Techniques for Suspect/Counterfeit EEE Parts Detection by Thermomechanical Analysis (TMA) Test Methods

2016-12-09
WIP
AS6171/18
This test method provides the capabilities, limitations, and suggested possible applications of TMA as it pertains to detection of suspect/counterfeit EEE parts. Additionally, this document outlines requirements associated with the application of TMA including: equipment requirements, test sample requirements, methodology, control and calibration, data analysis, reporting, and qualification and certification.
Standard

Technique for Suspect/Counterfeit EEE Parts Detection by Laser Scanning Microscopy (LSM) and Confocal Laser Scanning Microscopy (CLSM) Test Methods

2015-12-17
WIP
AS6171/17
This document defines capabilities and limitations of LSM and CLSM as they pertain to suspect/counterfeit EEE part detection. Additionally, this document outlines requirements associated with the application of LSM and CLSM including: operator training, sample preparation, various imaging techniques, data interpretation, calibration, and reporting of test results. This test method is primarily directed to analyses performed in the visible to near infrared range (approximately 400nm to 1100nm). The Test Laboratory shall be accredited to ISO/IEC 17025 to perform the LSM and CLSM Test Methods as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 Scope statement, the specific method being accredited to: Option 1: All AS6171/17 Test Methods, or Option 2: All AS6171/17 Test Methods except CLSM. If SAE AS6171/17 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Standard

Techniques for Suspect/Counterfeit EEE Parts Detection by Auger Electron Spectroscopy (AES) Test Method

2016-12-09
WIP
AS6171/19
This document defines capabilities and limitations of Auger Electron Spectroscopy (AES) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of AES including: operator training and requirements; sample preparation; data interpretation and reporting of data.
Standard

Techniques for Suspect/Counterfeit EEE Parts Detection by Gas Chromatography/Mass Spectrometry (GC/MS) Test Methods

2016-12-09
WIP
AS6171/21
This document defines capabilities and limitations of Gas Chromatography/Mass Spectrometry (GC/MS) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of GC/MS including: operator training; sample preparation; various sampling techniques; data interpretation; computerized spectral matching; equipment maintenance; and reporting of data. The discussion is limited to unit mass resolution spectrometers such as quadrupole systems and electron impact ionization.
Standard

Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Photoelectron Spectroscopy (XPS) Test Method

2016-12-09
WIP
AS6171/20
To define capabilities and limitations of X-Ray Photoelectron Spectroscopy (XPS) as it pertains to detection of suspect/counterfeit EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of XPS including: operator training and requirements; sample preparation; data interpretation; and data reporting procedures.
Standard

TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIATED ELECTROMAGNETIC EMISSION (REME) ANALYSIS TEST METHODS

2016-05-16
WIP
AS6171/14
The intent of this document is to define the methodology for suspect/counterfeit parts inspection using REME Analysis. The purpose of REME Analysis for suspect counterfeit part inspection is to detect misrepresentation or tampering of a part. REME Analysis can also potentially detect unintentional damage to the part resulting from improper removal of the part from assemblies, exposure to electrostatic discharge, exposure to radiation outside of acceptable limits (ionizing or high-power electromagnetic), or degradation. Improper removal of part from assemblies may include, but is not limited to, prolonged elevated temperature exposure during desoldering operations or mechanical stresses during removal. Degradation may include, but is not limited to, prolonged burn-in/testing, exposure to out-of-specification environmental conditions, or use outside of expected electrical tolerances.
Standard

Technique for Suspect/Counterfeit EEE Parts Detection by Secondary Ion Mass Spectrometry (SIMS) Test Method

2015-09-18
WIP
AS6171/13
To define capabilities and limitations of SIMS as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of SIMS including: Operator training; Sample preparation; Data interpretation; Equipment maintenance; and Reporting of data. The Test Laboratory shall be accredited to ISO/IEC 17025 to perform the SIMS Test Method as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 Scope statement, the specific method being accredited to: Option 1: All AS6171/13 Test Methods, or Option 2: All AS6171/13 Test Methods except imaging and 3D imaging, or Option 3: All AS6171/13 Test Methods except depth profiling and 3D imaging. If SAE AS6171/13 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Standard

AS6171 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PART PACKAGING DETECTION BY VARIOUS TEST METHODS

2016-02-03
WIP
AS6171/15
Non-conformance and now Suspect counterfeit packaging represents a hazard to electrostatic discharge (ESD) sensitive devices or components through cross contamination during transport and storage while generating high voltage discharges to ESD sensitive devices during in shipping, the inspection process, handling and manufacturing. Several aerospace related issues involve long-term storage supplier non-conformance with antistatic foams, antistatic bubble, antistatic pink poly, vacuum formed antistatic polymers, Type I moisture barrier bags and Type III static shielding bags have posed issues. The late John Kolyer, Ph.D. (Boeing, Ret.) and Ray Gompf, P.E., Ph.D. (NASA-KSC, Ret.) were advocates in the utilization of a formalized physical testing material qualification process. Today, however, prime contractors and CMs rely heavily upon a visual inspection process for ESD packaging materials.
Standard

Technique for Suspect/Counterfeit EEE Parts Detection by Scanning Electron Microscopy (SEM) including Energy Dispersive X-Ray Spectroscopy Test Methods

2017-06-13
WIP
AS6171/22
To define capabilities and limitations of SEM-EDS as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of SEM-EDS including: Operator training; Sample preparation; Data interpretation; Equipment maintenance; and Reporting of data. If SAE AS6171/22 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
X