Refine Your Search

Search Results

Viewing 1 to 2 of 2
Technical Paper

Vehicle Road Simulation Testing, Correlation and Variability

2005-04-11
2005-01-0856
In this paper, responses from a vehicle's suspension, chassis and body, are used to demonstrate a methodology to optimize physical test results. It is well known that there is a variability effect due to an increase of wheel unsprung mass (due to loads measurement fixturing), tire pressure, speed, etc. This paper quantifies loading variability due to Wheel Force Transducer (WFT) unsprung mass by using a rainflow cycle counting domain. Also, presents a proving ground-to-test correlation study and the data reduction techniques that are used in road simulation test development to identify the most nominal road load measurement. Fundamental technical information and analytical methodology useful in overall vehicle durability testing are discussed. Durability testing in a laboratory is designed to correlate fatigue damage rig to road. A Proving Ground (PG) loading history is often acquired by running an instrumented vehicle over one or more PG events with various drivers.
Technical Paper

Criteria to Determine the Necessity of Data Acquisition for RTS Drive File Development due to Vehicle Parameter Changes

2005-04-11
2005-01-0858
Durability of automotive structures is a primary engineering consideration that is required to be assessed at every design and development stage. Due to limitations of the analytical and experimental tools, the current practice in the automotive industry is to conduct a new data acquisition over a proving ground schedule whenever there are changes in the suspension parameters. This is a time-consuming and expensive operation. This paper provides guidelines for product teams to determine if a new vehicle data acquisition is needed when there are changes in vehicle parameters, and the corresponding effect on Road Test Simulator (RTS) drive file development. The application of this methodology to a truck with and without tuned suspension parameters is described in detail.
X