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The thick oxide layer of silicon-on-insulator (SOI) devices significantly reduces the junction leakage current at elevated temperatures compared to similar Si devices, resulting in an elevated maximum operating temperature. The maximum operating temperature, specified by manufacturers, of commercial SOI devices/circuits with conventional packaging is usually 225°C. It is important to understand the performance and de-ratings of these SOI circuits at temperatures above 225°C without the temperature limit imposed by commercial packaging technology. This work tested a low frequency square-wave oscillator based on an SOI 555 Timer with a special high temperature ceramic packaging technology from room temperature to 375°C. The timer die was attached to a 96% aluminum oxide substrate with high temperature durable gold (Au) thick-film metallization, and interconnected with Au wires.

Operational issues encountered by Apollo astronauts relating to lunar dust were catalogued, including material abrasion that resulted in scratches and wear on spacesuit components, ultimately impacting visibility, joint mobility and pressure retention. Standard methods are being developed to measure abrasive wear on candidate construction materials to be used for spacesuits, spacecraft, and robotics. Calibration tests were conducted using a standard diamond stylus scratch tip on the common spacecraft structure aluminum, Al 6061-T6. Custom tips were fabricated from terrestrial counterparts of lunar minerals for scratching Al 6061-T6 and comparing to standard diamond scratches. Considerations are offered for how to apply standards when selecting materials and developing dust mitigation strategies for lunar architecture elements.