Sample Size Reduction Based on Historical Design Information and Bayesian Statistics
Numerous test data have been generated in many testing institutions over the years and the historical information from previous similar designs and operating conditions can shed light on the current and future designs since they would share some common features when the changes are not drastic. To effectively utilize the historical information for current and future designs, two steps are necessary: (1) finding an approach to consistently correlate the test data; (2) utilizing Bayesian statistics, which can provide a rigorous mathematical tool for extracting useful information from the historical data. In this paper, a procedure for test sample size reduction is proposed based on historical fatigue S-N test data and Bayesian statistics. First, the statistical information is extracted from a large amount of fatigue test data collected over the years.