Refine Your Search

Search Results

Viewing 1 of 1
Technical Paper

Stress Measurement Techniques for Quantification of Stresses using X Ray Diffraction

2011-01-19
2011-26-0056
Accurate quantification of residual stresses is critical to predict expected fatigue life of the component. Quantification of residual stresses by X ray diffraction method offers substantial accuracy in results as compared to other methods of stress measurements. Depending on component processing and geometry, various stress measurement techniques are used to analyze stress patterns induced by these processing. This paper describes some of the stress measurement techniques by results obtained on two compressor valve (reed) samples which are undergone different processing. First reed sample is analyzed after blanking operation which is expected to give low compressive or tensile stresses whereas second reed sample is analyzed after tumbling operation which is done to get high compressive stresses.
X