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Standard

Vehicle Electromagnetic Immunity—Power Line Magnetic Fields

2010-01-07
HISTORICAL
J551/17_201001
This SAE Standard specifies the test methods and procedures for testing passenger cars and commercial vehicles to magnetic fields generated by power transmission lines and generating stations. SAE J551-1 specifies general information, definitions, practical use, and basic principles of the test procedure.
Standard

Vehicle Electromagnetic Immunity—Electrostatic Discharge (ESD)

2009-06-29
HISTORICAL
J551/15_200906
This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.
Standard

Vehicle Electromagnetic Immunity - Power Line Magnetic Fields

2015-07-22
CURRENT
J551/17_201507
This SAE Standard specifies the test methods and procedures for testing passenger cars and commercial vehicles to magnetic fields generated by power transmission lines and generating stations. SAE J551-1 specifies general information, definitions, practical use, and basic principles of the test procedure.
Standard

Vehicle Electromagnetic Immunity - Electrostatic Discharge (ESD)

2015-09-17
CURRENT
J551/15_201509
This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2017-09-22
CURRENT
J1752/3_201709
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2011-06-17
HISTORICAL
J1752/3_201106
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2011-06-24
HISTORICAL
J1752/2_201106
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2016-09-16
CURRENT
J1752/2_201609
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Electromagnetic Compatibility Measurements Procedure for Vehicle Components - Part 27 - Immunity to Radiated Electromagnetic Fields - Mode Stir Reverberation Method

2017-10-10
CURRENT
J1113/27_201710
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. The reverberation method is used to evaluate the immunity of electronic devices in the frequency range of 500 MHz to 2.0 GHz, with possible extensions to 200 MHz and 10 GHz, depending upon chamber size and construction. Optional pulse modulation testing at HIRF (High Intensity Radiated Fields) test levels, based upon currently known environmental threats, has been added to this revision of the standard. This document addresses the Mode Stir (Continuous Stirring) Reverberation testing method which has been successfully utilized as a design and production stage development tool for many years. The Mode Tuned (Stepped Tuner) Reverberation testing method is covered in the SAE J1113-28 document.
Standard

Electromagnetic Compatibility Measurements Procedure for Vehicle Components - Part 27 - Immunity to Radiated Electromagnetic Fields - Mode Stir Reverberation Method

2012-06-06
HISTORICAL
J1113/27_201206
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. The reverberation method is used to evaluate the immunity of electronic devices in the frequency range of 500 MHz to 2.0 GHz, with possible extensions to 200 MHz and 10 GHz, depending upon chamber size and construction. Optional pulse modulation testing at HIRF (High Intensity Radiated Fields) test levels, based upon currently known environmental threats, has been added to this revision of the standard. This document addresses the Mode Stir (Continuous Stirring) Reverberation testing method which has been successfully utilized as a design and production stage development tool for many years. The Mode Tuned (Stepped Tuner) Reverberation testing method is covered in the SAE J1113-28 document.
Standard

Electromagnetic Compatibility Measurement Procedures and Limits for Vehicle Components (Except Aircraft)—Conducted Immunity, 15 Hz to 250 kHz—All Leads

2010-08-06
CURRENT
J1113/2_201008
This document is an SAE Standard and covers the requirements for determining the immunity characteristics of automotive electronic equipment, subsystems, and systems to EM energy injected individually onto each lead. This test may be used over the frequency range of 15 Hz to 250 kHz. The method is applicable to all input, output, and power leads. The method is particularly useful in evaluating DUTs with acoustic or visible display functions.
Standard

Electromagnetic Compatibility Measurement Procedure for Vehicle Components - Part 13: Immunity to Electrostatic Discharge

2015-02-26
CURRENT
J1113/13_201502
This SAE Standard specifies the test methods and procedures necessary to evaluate electrical components intended for automotive use to the threat of Electrostatic Discharges (ESDs). It describes test procedures for evaluating electrical components on the bench in the powered mode and for the packaging and handling non-powered mode. A procedure for calibrating the simulator that is used for electrostatic discharges is given in Appendix A. An example of how to calculate the RC Time Constant is given in Appendix B Functional Performance Status Classifications for immunity to ESD and Sensitivity classifications for ESD sensitive devices are given in Appendix C.
Standard

Electromagnetic Compatibility Measurement Procedure for Vehicle Components - Part 13: Immunity to Electrostatic Discharge

2011-06-07
HISTORICAL
J1113/13_201106
This SAE Standard specifies the test methods and procedures necessary to evaluate electrical components intended for automotive use to the threat of Electrostatic Discharges (ESDs). It describes test procedures for evaluating electrical components on the bench in the powered mode and for the packaging and handling non-powered mode. A procedure for calibrating the simulator that is used for electrostatic discharges is given in Appendix A. An example of how to calculate the RC Time Constant is given in Appendix B Functional Performance Status Classifications for immunity to ESD and Sensitivity classifications for ESD sensitive devices are given in Appendix C.
Standard

Electromagnetic Compatibility Measurement Procedure for Vehicle Components - Immunity to AC Power Line Electric Fields

2019-04-30
WIP
J1113/26
This SAE Recommended Practice covers the recommended testing techniques for the determination of electric field immunity of an automotive electronic device when the device and its wiring harness is exposed to a power line electric field. This technique uses a parallel plate field generator and a high voltage, low current voltage source to produce the field.
Standard

Electromagnetic Compatibility Measurement Procedure for Vehicle Components - Immunity to AC Power Line Electric Fields

2014-04-16
CURRENT
J1113/26_201404
This SAE Recommended Practice covers the recommended testing techniques for the determination of electric field immunity of an automotive electronic device when the device and its wiring harness is exposed to a power line electric field. This technique uses a parallel plate field generator and a high voltage, low current voltage source to produce the field.
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