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Standard

Zero Acceptance Number Sampling Procedures and Tables for Inspection by Attributes of A Continuous Manufacturing Process

2015-07-01
CURRENT
EIA584
Conventional attribute sampling plans based upon nonzero acceptance numbers are no longer desirable. In addition, emphasis is now placed on the quality level that is received by the customer. This relates directly to the Lot Tolerance Percent Defective (LTPD) value or the Limiting Quality Protection of MIL-STD-105. Measuring quality levels in precent nonconforming, although not incorrect, has been replaced with quality levels measured in parts per million (PPM). As a result, this standard addresses the need for sampling plans that can augment MIL-STD-105, are based upon a zero acceptance number, and address quality (nonconformance) levels in the parts per million range. This document does not address minor nonconformances, which are defined as nonconformances that are not likely to reduce materially the usability of the unit of product for its intended purpose.
Standard

Using EDIF 200 for Schematic Transfer

2016-06-16
CURRENT
EIAEDIFAG1
This document offers some conventions for the use of EDIF in transfer applications involving schematic designs. It discusses the use of EDIF 2 0 0 constructs that apply to the SCHEMATIC view. This document does not attempt to cover the use of EDIF for the transfer of all design aspects, It is intended to be a starting point for implementing EDIF schematic translators. It is not an EDIF user manual. It is not an amendment to the EDIF 2 O O Recommended Standard ANSIIEIA-548, which contains the official definition of the format and should always be taken as the authoritative source of EDIF information. This document assumes you are familiar with schematic capture systems but not familiar with EDIF. You will need to refer to EIA-548 for detailed definitions of some of the constructs discussed below.
Standard

TechAmerica Technical Fellow and Associate Technical Fellow Nomination and Selection Handbook

2016-07-12
CURRENT
GEIAOP0003
This handbook details the TechAmerica Technical Fellowship Selection Process. It identifies the tasks to be performed and associates them with participants in the process. The focus is intended to keep the process implementation as uniform as possible. There are three types of information in this handbook: Process details Candidate Application Package format Process infrastructure and description Each Section of this handbook describes a significant segment of the selection process. There are also appendices that contain a variety of supporting material relevant to the different process participants.
Standard

Style Manual for Standards and Other Publications of TechAmerica

2015-07-01
CURRENT
GEIAOP0002
This style manual establishes requirements for the preparation of standards and certain other publications of TechAmerica). These requirements are intended to ensure that such documents are presented in as uniform a manner as practicable, irrespective of the technical content. Included are requirements for content; general style; and style for special elements such as equations, tables, and figures. They will help ensure that a standard is well organized and that it is consistent in style and presentation within itself and with other standards published by TechAmerica. Formulating committees and working groups should comply with the requirements set forth in this manual to make the product of the committee's work available for application in as short a time as possible. The TECHAMERICA Standards and Technology Department will use this manual to resolve nontechnical comments received as a result of public review of proposed standards.
Standard

Statistical Process Control Systems

2015-07-01
CURRENT
EIA557B
The general requirements of an SPC system shall encompass, but are not limited to, the following elements: a Overall quality system b Management commitment c SPC system documentation d Critical process nodes e Gage characterization and capability f Process characterization and capability g Control system documentation h On-line/off-line control i Training j Supplier SPC systems k Calibration l Preventive maintenance m Self audit
Standard

Specification Policy Guide

2016-06-16
CURRENT
EIAQAB7
This document has been formulated as a suggested guide in assisting EIA Engineering Department Panels and JEDEC Councils in cooperating with the Defense Department and other Federal agencies in the preparation of suggested reliability requirements for various types of electronic products as part of a program designed to enhance the reliability of defense and related equipment. The document is to be followed merely as a guide and is not intended to limit technical groups in the consideration of the factors to be taken into account in the development of reliability specifications for recommendation to the Government.
Standard

Software Life Cycle Processes - Implementation Considerations

2016-06-16
CURRENT
IEEEEIA12207_2
This guide provides implementation consideration guidance for the normative clauses of IEEE/EIA 12207.0. The guidance is based on software industry experience with the life cycle processes presented in IEEE/EIA 12207.0.
Standard

Process Improvement Guidelines

2015-07-01
CURRENT
EIA832
The procedure outlined in this document is applicable to any manufacturing or service process. It may be used on part of a process or and entire process or a series of sequential processes.
Standard

National Electronic Process Certification Standard

2016-06-17
CURRENT
EIA599A
This Standard is applicable to suppliers of electronic components, assemblies, equipment and related materials. This standard establishes the general requirements to achieve a certified process. The use of this standard is intended for any manufacturing or service company whose goal is to achieve customer satisfaction through continuous improvement.
Standard

Model for Integrating Metrics into the Procurement Process

2016-06-16
CURRENT
EIA830
To describe a model that is applicable during the acquisition process to gain insight into suppliers' approaches to using metrics in monitoring, managing, and improving their processes and products. This model also facilitates a common framework to understand and recognize potential suppliers' performance on relevant past contracts or purchase orders.
Standard

Managing the Development of Artificial Intelligence Software

2016-05-31
CURRENT
CRB1
Expert systems are a wave of the information processing future. As time goes on they will become more and more part of the mainstream. However, a necessary prerequisite to moving them into widespread use is to reduce the methodologies for expert system development closer to the more generally accepted software engineering techniques. This report offers a step towards that goal. It describes an alternative software life cycle model for expert system development. Since the field of Artificial Intelligence is so broad, this report limits the software to be considered. Systems that would be of the greatest interest to DoD over the next 5 to 7 years would be expert systems that have the following attributes: - may reason with uncertainty - are not necessarily rule-based - are non-learning systems. For these systems, a developmental cycle is articulated, and each phase of the cycle described.
Standard

Lot Acceptance Procedure for Verifying Compliance With the Specified Quality Levels (SQL) in PPM

2016-05-31
CURRENT
EIA555
This Specification covers a statistical sampling plan for lot inspection by attributes. It verifies that the customer's specified quality level (SQL) is not being exceeded. The estimate of fraction nonconforming determined by EIA Interim Standard No. EIA-554 is used to select the optimum sample plan for verifying that a given lot meets the specified quality level (SQL).
Standard

Library of Parameterized Modules (LPM) Version 210

2015-07-01
CURRENT
EIAIS103A
This document is the authoritative reference for the Library of Parameterized Modules (LPM) standard version 2 1 O. This specification defines the semantics of each module along with a complete description of the module's functionality as well as the syntaxfor instantiating LPM modules in an EDIF netlist. The intended audience for this document is CAE vendors, silicon vendors, and only secondarily, logic designers. It is assumed that the reader is familiar with logic design, design automation tools and silicon implementation options. What the reader should get out of this document is an understanding of the benefits of the LPM standard as well as the details required to implement an LPM interface.
Standard

Introduction to EDIF, Volume 1

2016-06-16
CURRENT
EIAEDIF1
The increase in the number of silicon foundries and CAD/CAE system and workstation companies, and the problem of movement of data among in-house design systems has made a standard interchange format for electronic design data essential. The benefits of the general adoption of a standard interchange format are important and far reaching. The customer receives a much wider variety of feasible choices, and free competition in both CAEYCAD system/tool businesses and foundry businesses is enhanced. The electronic circuit designer and customer of CAE/CAD system and foundry service can expect compatibility among these products. The designer can choose equipment and services best suited for a particular task with a minimum of overhead. Foundries can work with customers regardless of the CAE/CAD equipment that the customer is using.
Standard

Interchangeable Variable Block Data Format for Positioning, Contouring, and Contouring/Positioning Numerically Controlled Machines

2016-06-16
CURRENT
RS274D
This standard is intended to serve as a guidein the coordination of system design, to minimize the variety of program manuscripts required, to promote uniformity of programming techniques, and to foster interchangeability of input data between numerically controlled machines of the same classification by type, process function, size, and accuracy. It is intended that simple numerically controlled machines be programmed usinga simple format, which is systematically expandable for morec omplex machines.
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