Refine Your Search

Topic

Search Results

Standard

ETCH INSPECTION OF HIGH STRENGTH STEEL PARTS

1996-10-01
HISTORICAL
AMS2649B
This specification establishes the requirements for etch inspection of bare high-strength low-alloy steel parts having tensile strength of 180 ksi (1241 MPa) and higher and of carburized parts to detect overheating caused by abusive machining or grinding in the heat treated condition. This process may remove 0.0001 to 0.0005 inch (2.5 to 12.7 μm) from the surface of the part.
Standard

Etch Inspection of High Strength Steel Parts

2008-01-03
HISTORICAL
AMS2649C
This specification establishes the requirements for etch inspection of bare high-strength low-alloy steel parts having tensile strength of 180 ksi (1241 MPa) and higher and of carburized parts to detect overheating caused by abusive machining or grinding in the heat treated condition, and to detect localized discontinuous carburization. This process is not applicable to surface hardened steels produced by nitriding or carbonitriding. This process may remove 0.0001 to 0.0005 inch (2.5 to 12.7 micrometers) from the surface of the part.
Standard

Etch Inspection of High Strength Steel Parts

2018-09-20
WIP
AMS2649E
This specification establishes the requirements for etch inspection of bare high strength low alloy steel parts having tensile strength of 180 ksi (1241 MPa) and higher and of carburized parts to detect overheating caused by abusive machining or grinding in the heat treated condition, and to detect localized discontinuous carburization. This process is not applicable to surface hardened steels produced by nitriding or carbonitriding. This process may remove 0.0001 to 0.0005 inch (2.5 to 12.7 micrometers) from the surface of the part.
Standard

Etch Inspection of High Strength Steel Parts

2013-12-13
CURRENT
AMS2649D
This specification establishes the requirements for etch inspection of steel parts to detect overheating (rehardening or overtempering) caused by abusive machining or grinding, or to detect localized discontinuous carburization.
Standard

INSTRUMENTAL METHODS OF DETERMINING SURFACE CLEANLINESS

1989-07-01
HISTORICAL
ARP4252
This Aerospace Recommended Practice is intended as a guide toward standard practices for the determination of surface cleanliness that are applicable to field operation. Some of these methods can also be used to determine quality assurance that a surface has been properly prepared and maintained. The instrumental methods are: Wettability, Surface Potential Difference (SPD), Ellipsometry, and Optically Stimulated Electron Emission (OSEE). Each instrument is described with respect to measurement techniques, limitations, and advantages and types of available instruments. Elementary theoretical principles and examples of the use of each instrument are also given.
Standard

Instrumental Methods of Determining Surface Cleanliness

2006-08-15
HISTORICAL
ARP4252A
This Aerospace Recommended Practice is intended as a guide toward standard practices for the determination of surface cleanliness that are applicable to field operation. Some of these methods can also be used to determine quality assurance that a surface has been properly prepared and maintained. The instrumental methods are: Wettability, Surface Potential Difference (SPD), Ellipsometry, and Optically Stimulated Electron Emission (OSEE). Each instrument is described with respect to measurement techniques, limitations, and advantages and types of available instruments. Elementary theoretical principles and examples of the use of each instrument are also given.
Standard

Instrumental Methods of Determining Surface Cleanliness

2017-09-20
CURRENT
ARP4252B
This Aerospace Recommended Practice is intended as a guide toward standard practices for the determination of surface cleanliness that are applicable to field operation. Some of these methods can also be used to determine quality assurance that a surface has been properly prepared and maintained. The instrumental methods are: Wettability, Surface Potential Difference (SPD), Ellipsometry, and Optically Stimulated Electron Emission (OSEE). Each instrument is described with respect to measurement techniques, limitations, and advantages and types of available instruments. Elementary theoretical principles and examples of the use of each instrument are also given.
X