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This specification is a general level subsystem light source specification that establishes test requirements of light emitting diode (LED) components and modules for use in automotive lighting systems. The completed test data from this test specification is intended to be provided to the OEM by the Tier 1 lamp set maker as part of the lamp assembly PPAP. Re-testing shall be required if any portion of the approved LED module experiences a design, manufacturing, or component change. This document shall be applied to systems that meet the requirements for design, performance, and validation established by government standards. The LED module is defined as the LED devices and any electronics required to properly energize the LEDs using a vehicle electrical power system along with any associated electrical wiring, connectors, and thermal management system. Samples shall be tested as a subsystem and considered one test sample for the entire test sequence.

This specification is a general level subsystem light source specification that establishes test requirements of Light Emitting Diode (LED) components and modules for use in automotive lighting systems. The completed test data to this test specification is intended to be provided to the OEM by the Tier I lamp set maker as part of the lamp assembly PPAP. Re-testing shall be required if any portion of the approved LED modules experiences a design, manufacturing or component change. This document shall be applied to systems that meet the requirements for design, performance and validation established by government standards. The LED module is defined as the LED devices and any electronics required to properly energize the LEDs using vehicle electrical power system along with any associated electrical wiring, connectors and thermal management system. Samples shall be tested as a subsystem and considered one test sample for the entire test sequence.

This specification establishes the requirements and test procedures for automotive miniature bulb retention devices, including wedge base sockets with integral connectors, direct wire wedge base sockets, bayonet base sockets with integral connectors, direct wire bayonet base sockets, wedge base and bayonet base sockets with circuit plate assemblies, and associated interfaces. Tests shall follow the sequence shown in the flow charts in Appendices E and F whenever the following occurs: New design. Design, material, or process change made to an existing device, which could affect the outcome of the test. The test sequences shown in Appendix G shall be run annually.

The procedures contained in this specification cover the laboratory testing of miniature incandescent bulbs for use in automotive illumination and signaling applications.